Achieving functional safety levels mandated by the ISO 26262 standard requires periodic testing of a vehicle’s electronics. This testing can be applied at three distinct time periods, each with its ...
MOSAID Technologies Incorporated announced the availability of its BIST (built in self-test) controller for embedded memory applications. The BIST controller has already been licensed to a lead ...
SAN JOSE, Calif. — Embedded-test specialist LogicVision Inc. today (Sept. 22, 2003) rolled out a new built-in-self-test (BIST) product line that promises to reduce IC-test cycles times by two months ...
Tessent MemoryBIST from Siemens EDA provides a complete solution for at-speed test, diagnosis, repair, debug and characterization of embedded memories. Leveraging a flexible hierarchical architecture, ...
A unique opportunity to address SOC accuracy vs. cost of test challenges comes with the development of BIST Assist 6.4 by Agilent Technologies. When integrated into Agilent�s 93000 Series SOC Tester ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results