Multiple electrostatic and electromagnetic lenses are involved in managing the trajectory and shape of the electron beam. An electron source. The sample chamber is placed under high-vacuum. Electron ...

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

Within cells lies an intricate, microscopic world that remains invisible to the human eye. To visualize cellular details, scientists rely on the power of electron microscopes. With unparalleled ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

A team of researchers at the University of Victoria (UVic) have achieved a major breakthrough in electron microscopy that will allow scientists to visualize atomic-scale structures with unprecedented ...

SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for ...

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All users of any A&TS laboratory are required to complete health and safety training provided by the ESF office of Environmental Health and Safety Services. Lab users are referred to the Laboratory ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...