Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...
Abstract: The deep neural network (DNN) models are widely used for object detection in automated driving systems (ADS). Yet, such models are prone to errors which can have serious safety implications.
Despite these box-office triumphs, discussion around the Avatar franchise continues to centre on its perceived lack of ...
Not every 3D print is a win. These prints caused more frustration than fixes once real-world heat, weight, and daily use set ...
Researchers at The University of Texas at Austin recently received support from the National Science Foundation (NSF) to ...